Understanding the cause of failures within semiconductor components at the earliest stage of the production pipeline is key to keeping costs down and efficiencies up. Recent developments in this technique have exploited the use of laser scanning near-IR microscopy for the purposes of through-silicon fault localisation and defect characterisation.
Chromacity has developed a laser source that provides ultrashort pulses between 1250 nm – 1310 nm (depending on application). This can be implemented within a soft defect localisation and laser assisted device localisation (LADA) platform to create two-photon absorption-induced single–event upsets (SEU). Our technologies are at the forefront of developing next-generation failure analysis techniques.
The Chromacity sources allows the FA community to implement ultrafast nonlinear optoelectronic probing platforms for the purpose of advanced IC debug and characterisation with the best localised volumetric resolution performance. In addition to the impressive spatial performance of both 2pLADA and 2pSEU, the temporal performance of this technique offers the significant ability to characterise failures that have yet to be fully discovered.
The Chromacity OPO has also demonstrated capabilities to interrogate next generation Integrated Circuits (ICs) across the telecoms wavelength bands and beyond. Ultrashort pulse near-IR radiation can deliver significant levels of peak optical power to a functional device, which can temporarily disturb the prescribed digitisation level in local memory cells, holding their individual transistors in artificially high electronic states until the operational sequence is reiterated, making our technology the best in class.
The ability to monitor greenhouse gases, and other pollutants in our atmosphere, is a growing global concern. Achieving this requires spectroscopic techniques that can help discover what toxic species are in our atmosphere and determine mitigating steps that can be taken to reduce them. In addition, being able to identifying gas leaks (quantify and qualify) in real time or monitor the quality of powders and liquids are equally important for a range of research and commercial applications.
The high average powers and short pulse durations, along with the high spatial and spectral brightness, of our Chromacity OPO, allows the detection of gas molecules with 0.05 cm-1 resolution and the ability to detect parts per billion concentrations. In addition, the wide tuning range of the system allows for the detection of many different chemical signatures.
Using FTIR techniques, our sources have demonstrated the capability to detect multiple hydrocarbon species, using open path techniques reaching beyond 100m.