Between 1250 nm – 1310 nm wavelengths, Chromacity’s femtosecond lasers deliver 80 fs pulse durations and excellent beam quality for optical fault isolation techniques, including Soft Defect Localization (SDL) and Laser Assisted Device Alteration (LADA).
Soft defects are characteristic of failures found in partially functional integrated circuits. SDL imaging systems apply laser-scanning methods, to generate localised heating and find defects. In contrast, LADA is a laser-based timing analysis technique which uses short wavelengths to generate photocarriers in silicon, without resulting in localised heating of the device.
Chromacity’s ultrashort-pulse systems can be deployed during 2P LADA techniques which generate two-photon absorption-induced single event upsets (SEU) in micro-electronic devices, such as microprocessors or power transistors.